DFT header

As circuit boards become more complex testability is a requirement rather than a luxury. Due to increasing component densities on smaller PCBs acceptable test coverage percentages are difficult to achieve using solely traditional methods of automated test. Modern designs require a combination of automated methods and manual inspections to achieve maximal test coverage at optimal cost.

DFT is central to the design phase of the product and must be addressed coincident with the product function implementation in order for it to be most effective. eES works with our clients to develop an optimal DFT plan according to product complexity, manufacturing and your company needs. Some, but not all, of the methods we evaluate and employ are:

• Manual Inspection
• In-Circuit Test (ICT)
• Flying Probe
• Automated Optical Inspection (AOI)
• X-Ray Inspection
• Manufacturing Defect Analyzer (MDA)
• Boundary Scan
• Built-In-Self-Test (BIST)
• Digital Functional Automatic Test (DFAT)


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